depth profile的意思

depth profile中文翻譯：

沿深度摻雜分布圖；深度剖面

相似詞語短語

depth───n.[海洋]深度；深奧

profile───vi.給出輪廓；n.側面；輪廓；外形；剖面；簡況；vt.描…的輪廓；扼要描述

great depth───大縱深；大深度

backband profile───背帶輪廓

soil profile───[土壤]土壤剖面；土層剖面；泥土成分；土剖面

profile maker───型材制造機

midship depth───船中深度

axially depth───軸向深度

moulded depth───[船]型深；模深

雙語使用場景

The depth profile of above nuclides in sediment core and its oceanographic significance were studied.───對巖心中各個核素的深度分布特征及其所蘊含的海洋學意義進行了研究。

This paper describes a mechanical method for preparation of depth profile of a sample.───本文介紹制備樣品深度剖面的一種機械方法。

Some of the characteristics of boron depth profile in these films were presented.───給出了不同襯底溫度下淀積薄膜中硼深度分布的一些特征。

Microhardness, depth profile and wear mechanisms were investigated by means of MVK H12, TALYSURF6, XPS and microscopy.───采用顯微硬度、輪廓深度、XPS、顯微鏡觀察等研究磨損機理。

If pressure is lower, the goal of depth profile control can't be achieved.───如果控制過低，擠入總量往往達不到深度調剖的目的。

Standard Practice for Analytically Describing Sputter-Depth-Profile Interface Data by an Extended Logistic Function───用擴展的邏輯函數分析描述濺射深度分布界面數據的標準規范

Secondary ion mass spectroscopic depth profile analysis of oxygen contamination in hydrogenated microcrystalline silicon───二次離子質譜深度剖面分析氫化微晶硅薄膜中的氧污染

Determination of structural characteristics and depth profile of platelet defects in hydrogen-implanted silicon wafers by HREM───注氫硅片中片狀缺陷的結構特征及其深度分布的高分辨電鏡研究

Study on depth profile analysis of the coating of colored steel strips by glow discharge optical emission spectrometry───彩涂鋼板涂鍍層的輝光放電發射光譜逐層分析方法研究

英語使用場景

Depth profile analysis plays a major role in surface research and analysis of steel products.

Depth profile of the SiOF thin film from secondary ion mass spectroscopy showed the uneven distribution of F in the film.

A non-destructive remote technique for obtaining depth profile of laser processed metals by laser- induced IR photothermal radiometry is reported.

Discharge conditions at which depth profile analysis of tinplate had good depth resolution were selected by researching spectrometric behaviors of tinplate at different discharge conditions.

A certain functional relation was found between the depth profile of elements analyzed by AES and efficiency of the cell.