electromigration的意思

electromigration中文翻譯：

n.電遷移

相似詞語短語

electromagnetic waves filter───電磁波過濾器；防輻射貼

magnetism and electromagnetism───磁學與電磁學

electromagnetic energy───[電磁]電磁能

electromagnetic induction───[電磁]電磁感應，電磁效應；感應電流；電磁離合器

electromagnetic waves───[醫]電磁波；n.[電磁]電磁波（electromagneticwave的復數形式）

electromotive force emf───電動勢

electromagnetic wave───[電磁]電磁波；n.電磁波

electrometrical───adj.電測的

electromagnetic spectrum───電磁波頻譜；[電磁]電磁譜，[電磁]電磁波譜

electromotor───n.電動機，電氣馬達

雙語使用場景

reasons and the influencing factors of IR-drop and electromigration are discussed firstly.───本文首先介紹了IR壓降和電遷移現象的產生原因及其影響因素。

Electromigration in metal thin film interconnection is one of the important problems for VLSI reliability.───金屬薄膜互連的電遷移現象是VLSI最重要的可靠性問題之一。

Electromigration is the movement of metal atoms in the direction of current flow.───電遷移是金屬原子沿著電流方向的移動。

The electromigration of Cd in contaminated kaolin soil by an iron (Fe) and activated char (C) primary cell.───以鐵屑和活性炭構建的（原）電池研究不同電極間距下高嶺土中的鎘在（原）電池電場下的電動力學遷移。

As an electric current passes through, the Joule heating and electromigration effects occur in the flip chip solder bumps.───當電流通過焊點時，會伴隨產生焦耳熱效應和電遷移效應。

The effects of annealing and nitrogen as a diluting gas on the electromigration resistance of deposited copper film were also investigated.───考察了沉積后退火以及氮氣作為稀釋氣體對沉積的銅薄膜抗電遷移率的影響。

II Abstract The electromigration of solder at solid state was studied in the past, but it was not discussed at liquid state.───I在以往焊錫的電遷移研究中，探討對象都是固態焊錫，而液態焊錫是未被探討的。

With higher current and smaller size trends, electromigration in flip-chip solder has become an critical of reliability concern.───伴隨積體電路高電流、小尺寸的設計變化，覆晶焊錫接點內的電遷移現象成為元件可靠度的影響關鍵。

Having 40% lower resistivity than Al and good electromigration resistance, Cu is being considerably studied as candidate of Al.───銅的電阻率比鋁低40%，有更好的抗電遷移能力，因而被作為鋁的替代材料而受到廣泛研究。

英語使用場景

Electromigration effect is still a dominating failure mechanism of interconnect for deep submicron and ultra-deep submicron scale.

On the other hand, high supply flowing through the power grids may cause electromigration failures.

Two main methods, accelerated lifetime test and drift velocity test, to study electromigration are described.

Electromigration is the movement of metal atoms in the direction of current flow.

Electromigration dispersion ( EMD ) is one of major effects on zone broadening in capillary electrophoresis.

Having 40% lower resistivity than Al and good electromigration resistance,(sentencedict.com/electromigration.html) Cu is being considerably studied as candidate of Al.

In electromigration, the expressions to atomic flux and Ni-Sn IMC growth rate have been derived from the phenomenological equations.

Electromigration in metal thin film interconnection is one of the important problems for VLSI reliability.

On studying of electromigration on lead-free solder joints, the theories and the current studies on electromigration have been introduced firstly.