bist的意思

bist中文翻譯：

n.阿拉伯學者

相似詞語短語

bist wishes───bist愿望

雙語使用場景

BIST has been applied into transient current testing as an effective method to reduce testing spending.───測試(BIST)是一種有效降低測試開銷的技術，在瞬態電流測試中得到了應用。

Gary Bist is a Staff Technical Writer at IBM's Toronto Lab.───Gary Bist是IBM多倫多實驗室的專職技術作家。

structure circuit is simple and feasible, and the corresponding algorithm is easy to achieve.───電路結構簡單可行，提供的相應算法也易于實現。

The proposed BIST scheme relies on a pseudo-random testing phase and a deterministic phase.───這一自測試策略包含偽隨機測試階段和確定性測試階段。

Define test methodology (SCAN, BIST, JTAG etc. ) for the entire chip. Test pattern generation and optimization.───制定芯片整體測試方法（SCAN，BIST，JTAG等）。制定和優化測試模式。

Template is a cornerstone in the BIST for software, which affect the effectiveness and efficiency in software testing.───模板是軟件內建自測試系統的基石，其內容關系到整個系統的性能和效果。

Recently, a BIST scheme using test patterns applied by Circuit-under-Test (TPAC) is proposed.───由被測電路自己施加測試向量的內建自測試方法是最近新提出的一種自測試技術。

Build-In Self-Test (BIST) is a commonly used DFT technologies.───內建自測試技術是一種普遍使用的可測性設計方法。

英語使用場景

A novel built-in self-test(BIST) test pattern generator(TPG) was designed in order to avoid much hardware overhead and performance degradation when additional TPG was inserted for delay fault test.

The BIST of the principle of achieving is introduced first in this paper, then take the 8-bit ripple carry adder as an example, describes the design process of BIST.

The implementation of BIST is offered, and the fault-coverage-rate of "data rearrangement" module and "FFT and moduling" is calculated.

New design of programmable memory BIST for embedded dual ports SRAM is presented based on analyzing faults model.

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A fast and improved method for BIST is introduced, which is aimed to improve the fault test method for combinational circuit.

The methods of testing VLSI circuits mainly include ATE-based external test, build-in self-test (BIST) and test resource partition (TRP) based optimization test.

With the fast growing portable electronics market and higher need of wafer test, power consumption problem of built in self test (BIST) has attracted more and more considerations.

A BIST of 512 bits static RAM by using Concorde Compiler is designed and simulated.